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6
Chapter 1
General Information
Introduction
Excess Noise Ratio Expanded Uncertainty (U(Y)) - Table 1-2
ENR values are given at cardinal frequency points over the frequency
range of each noise source. These values are stored within the noise
sources internal EEPROM and documented on the calibration report.
The uncertainty analysis for the calibration of the noise sources is in
accordance with the ISO/TAG4 Guide. The uncertainty data reported on
the calibration report is the expanded uncertainty (U(Y)) with 95%
confidence level and a coverage factor of 2. This uncertainty analysis is
valid for APC 3.5mm and Type-N (option 001) connector types.
A significant proportion of the expanded uncertainty (U(Y)) is based on
the uncertainties provided by the National Standards Institutes. Agilent
therefore reserve the right to change the overall expanded uncertainties
based on changes in uncertainty values within the National Standards
Institutes.
Uncertainties are valid at ambient temperature 23°C ±1°C (296K) only.
A typical characteristic plot of ENR (U(Y)) versus each cardinal
frequency point is shown in Figure 1-3.
Figure 1-3
Characteristic
1
ENR Plot versus Cardinal Frequency Points
1. Characteristic values are met or bettered by 90% of instruments with 90% confidence.
Содержание N4000A
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