ABB REG650 ANSI, Руководство по вводу в эксплуатацию

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consequence it may take up to an hour to save changes. If the auxiliary power is
interrupted before a change is saved, that change is lost.
5.2 Activating the test mode
Put the IED into the test mode before testing. The test mode blocks all protection
functions and some of the control functions in the IED, and the individual functions to
be tested can be unblocked to prevent unwanted operation caused by other functions.
In this way, it is possible to test slower back-up measuring functions without the
interference from faster measuring functions. The busbar differential protection is not
included in the test mode and is not prevented to operate during the test operations.
The test switch should then be connected to the IED.Test mode is indicated when the
yellow StartLED flashes.
1. Select Main menu/Tests/IED test mode/TESTMODE:1
2. Set parameter TestMode to On .
3. Save the changes.
As a consequence, the yellow startLED starts flashing as a reminder and remains
flashing until the test mode is switched off.
5.3 Preparing the connection to the test equipment
The IED can be equipped with a test switch of type RTXP8, RTXP18 or RTXP24. The
test switch and its associated test plug handle (RTXH8, RTXH18 or RTXH24) are a
part of the COMBITEST system, which provides secure and convenient testing of the
IED.
When using the COMBITEST, preparations for testing are automatically carried out
in the proper sequence, that is, for example, blocking of tripping circuits, short
circuiting of CT’s, opening of voltage circuits, making IED terminals available for
secondary injection. Terminals 1 and 8, 1 and 18 as well as 1 and 12 of the test switches
RTXP8, RTXP18 and RTXP24 respectively are not disconnected as they supply DC
power to the protection IED.
The RTXH test-plug handle leads may be connected to any type of test equipment or
instrument. When a number of protection IEDs of the same type are tested, the test-
plug handle only needs to be moved from the test switch of one protection IED to the
test switch of the other, without altering the previous connections.
Use COMBITEST test system to prevent unwanted tripping when the handle is
withdrawn, since latches on the handle secure it in the half withdrawn position. In this
position, all voltages and currents are restored and any re-energizing transients are
given a chance to decay before the trip circuits are restored. When the latches are
released, the handle can be completely withdrawn from the test switch, restoring the
trip circuits to the protection IED.
1MRK 502 049-UEN A
Section 5
Testing IED operation
37
Commissioning manual