A.H. Systems Model PAM-0118 Pre-Amplifier
INTENDED PURPOSES
This equipment is intended for general laboratory use in a wide variety of
industrial and scientific applications and designed to be used in the process of
generating, controlling and measuring high levels of electromagnetic Radio
Frequency (RF) energy. It is the responsibility of the user to assure that the
device is operated in a location which will control the radiated energy such that
it will not cause injury and will not violate regulatory levels of electromagnetic
interference.
HAZARDOUS RF VOLTAGES
The PAM-0118 preamplifier is reliable when operated under specified
conditions; however the use of sensitive, high-performance semiconductors
causes the preamplifier to be susceptible to ESD and EOS. The risk of damage
due to ESD is small, but possible, because the charged object would have to
come in contact with one of the center conductors. It is more likely that EOS
damage will cause the failure of the preamplifier.
ESD – (Electrostatic Discharge)
A discharge of static electricity can degrade or even worse, seriously damage
the preamplifier. There are two kinds of ESD damage that can occur. The worst
being severe resulting in complete failure of the preamplifier. This damage is
relatively easy to create although often expensive and time consuming to fix.
The second kind of damage is less severe and can result in degradation or
weakening of components which will not result in evident failure. This kind of
damage is difficult to detect and often results in faulty or degraded performance.
EOS – (Electrical Overstress)
Precautions against EOS should always be maintained while operating the
preamplifier. It must be emphasized that excessive power applied to the RF
input of the preamplifier will damage the input stage. EOS damage can even
occur when storing the preamplifier in areas of strong EMI or RFI fields.
Improper connection sequence is another possible source of EOS damage
such as application of RF signals to the preamplifier before powering up. When
connecting alternate sources of DC power caution should be made that
excessive Input DC voltage is not applied as this is another source of EOS
damage. Loose connections causing intermittent events can also damage the
preamplifier.
A.H. Systems inc. – April 2009
REV B
4