Agilent 7500 AFM
Data Sheet
Features and Benefits
•
Atomic resolution imaging with
closed loop 90µm scanner
• Exceptional environmental and
temperature control
• Standard nose cone supports
expanded set of imaging modes
•
Superior scanning in fluids, gases,
and ambient conditions
• Single-pass nanoscale electrical
characterization
•
Unprecedented electrochemistry
(EC) capabilities
Applications
•
Materials science
•
Life science
•
Polymer science
•
Electrochemistry
•
Electrical characterization
•
Nanolithography
System Overview
The Agilent 7500 AFM establishes
new performance, functionality, and
ease-of-use benchmarks for nanoscale
measurement, characterization, and
manipulation. This next-generation
system extends the forefront of atomic
force microscopy, offering a large closed
loop scanner with atomic resolution,
industry-leading environmental control,
ultra-high-precision temperature control,
an unrivaled range of electrochemistry
capabilities, and much more.
The clever, compact design of the 7500
gives researchers quick, convenient
access to their samples. half-dozen
most used AFM imaging modes are
supported by the system’s standard nose
cone, which can easily be interchanged
with specialized nose cones as needed,
extending capability effortlessly.
Whether serving academia or industry,
the Agilent 7500 is the new gold
standard for advanced FM applications
in the ields of electrochemistry, life
science, materials science, polymer
science, electrical characterization, and
nanolithography.
New AFM Design
The 7500 offers stable FM imaging
combined with exceptionally lat, easily
reproducible displacement over the entire
scan range to deliver high resolution and
very low distortion. gilent’s patented
top-down tip scanner technology is ideal
for imaging in luids and in air as well
as under controlled temperature and
environmental conditions.
The scanner’s standard nose cone
enables the use of contact mode, C
mode, current-sensing FM (CS-FM),
EFM, KFM, MFM, and MC Mode in
The Agilent 7500 AFM System.
