3 Product and Functional Description | 3.3 Optional Components and Accessories
ZEISS
The central hole is laser cut. As a result of this process, there is some silicon that beads up in areas
near the hole, but this silicon is conducting. It is therefore not charging up and not disturbing
your image quality.
NOTICE
Risk of property damage: Short working distance
When inserted, the aBSD detector is positioned directly underneath the objective lens. The
lower edge of the detector is then located at a working distance of 1.5 mm. If you move the
specimen to a working distance below 1.5 mm, then you damage the aBSD detector.
4
Do not move the specimen to working distances below 2 mm.
4
Be careful when you tilt the specimen.
3.3.1.5 aSTEM Detector
Purpose
The optional aSTEM (annular Scanning Transmission Electron Microscopy) detector consists of an
electron detector underneath an ultrathin specimen.
The aSTEM unit is equipped with diodes that are switched on or off in order to allow dark field
and bright field imaging.
1
2
3
1
Incident electron beam (primary electrons)
2
Thin specimen
3
Info
Risk of malfunction: The diode segments are sensitive to the light that is used for illumination
in TV mode (infrared and white).
When you use a diode detector, always make sure that the TV illumination is switched off. If
the CCD Mode is set to Auto Detect, then the TV illumination is automatically switched off
when a diode detector is used.
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Instruction Manual ZEISS Crossbeam 550L, Crossbeam 550 | en-US | Rev. 3 | 349500-8122-000
Summary of Contents for Crossbeam 550
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