Numerical counters are provided to let users know the status of the test, with a basic summary of the TIE information.
Current TIE:
Shows the current time interval error measurement.
Max TIE:
Maximum positive TIE value that has been recorded since the beginning of the test.
Min TIE:
lowest or negative TIE value that has been recorded since the beginning of the test. Since wander
measurements always start with a TIE=0, the minimum value can only be zero or negative.
MTIE:
Denotes the maximum span of TIE values recorded since the beginning of the test. In this summary, MTIE =
MaxTIE – MinTIE. It gives users an idea of how much the signal under test is wandering.
A real-time TIE monitor graph may also be included in the summary screen for users to see the TIE for the last 7 or 10
minutes of the ongoing test.
15.4.7.1 Built-in MTIE & TDEV Analysis (Optional)
This option enables the test set to analyze up to 72 hours’ worth of wander measurement data and compare it against standard
masks for a PASS/FAIL assessment, without the need for a PC. The test set may allow the analysis to be performed while the
test is still running for run-time verification. Longer test take a lot longer to be analyzed, so the VeEX Wander Analysis PC
Software is still recommended for tests longer than 24 hours.
Features:
• Provides further post-processing of clock stability data, such as MTIE and TDEV
• Frequency offset calculation and removal for relative TIE analysis
• Standard MTIE and TDEV masks can be selected
• MTIE and TDEV results and mask export to CSV for further report generation using spreadsheets
• Direct PDF report generation to USB
TIE Results
TIE Results
1. Date and Time stamp indicating when the test was started
2. Total of seconds recorded during the test
3. Beginning and end of the data set to be analyzed and displayed in the graph (5) below. Tap in the Start and/or End field
and enter the desired time limits, then press the Set Range button to apply these changes.
4. Based on all the TIE measurements captured, the test set automatically calculates any small difference in frequency
between the signal under test and the reference clock. Once the frequency difference is known, users can remove it to
perform Relative TIE measurements. The offset removal tool is important for field tests when the local reference clock
used is highly accurate and stable but not traceable to the PRC in the network core (e.g. a portable frequency reference).
Even if the frequency of the local reference is a few ppb (parts per billion) different than the PRC, it can still be used for
wander measurements, as long as it is highly stable, because the Offset Removal feature can mathematically remove the
know difference and make it as if a traceable reference had been used. Once removed, user can perform relative MTIE (or
MRTIE) and TDEV analysis.
5. Auto-scale TIE graph, based on the limits set.
6. Press the Measurement button to return to the current wander measurements
7. Fine cursor controls. User can use the stylus to tap on the screen to position the cursor and then use these arrow buttons
RXT-3900 e-Manual D07-00-111P Rev A00
Summary of Contents for RXT3900
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