Veeco Dimension 3100, Manual

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Magnetic Force Microscopy
Magnetic Force Microscopy
Rev. D Dimension 3100 Manual 257
15.1.2 Amplitude Detection Techniques
All standard Dimension-series SPMs are capable of MFM imaging using amplitude detection
techniques. By adding the Phase Extender or Quadrex Extender Electronics Modules to a
NanoScope III or IIIa controller, or by using a NanoScope IV controller, the Dimension 3100 may
be used for frequency modulation or phase detection with improved results (see
Figure 15.1b and
Figure 15.1c ). Amplitude detection has largely been superseded by frequency modulation and
phase detection. A more extensive discussion of force gradient detection and MFM imaging is
given in the reprint
Magnetic Force Microscopy: Recent Advances and Applications . Contact Veeco
to obtain a copy.
Figure 15.1b Extender Electronics Module for NanoScope III, IIIa Controllers
Figure 15.1c Quadrex PhaseImaging Module for NanoScope IIIa Controllers
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