Veeco Dimension 3100, Manual

Page: 124 / 376

Head, Probe, & Sample Preparation
Basic AFM Operation
104 Dimension 3100 Manual Rev. D
Figure 7.2c Standard AFM Cantilever Holder
4. Orient the cantilever intended for imaging away from the cantilever holder, and place the
substrate in the AFM cantilever holder groove.
5. Carefully maneuver the substrate until the substrate is flush against the back edge and laying
flat in the cantilever holder groove.
6. Press the spring-loaded probe clip down, gently push forward over the substrate, and release
the spring clip to hold the substrate in place in the cantilever holder groove.
Note: Always orienting the substrate to one side and the back of the cantilever holder
groove will improve repeatability of tip location between runs. This will make
aligning the laser onto the cantilever quicker and easier when installing new
cantilevers.
TappingMode
The procedure for installing TappingMode, single crystal silicon substrates is the essentially the
same as the procedure for installing silicon nitride substrates in Contact Mode AFM. However, one
difference is that silicon substrates usually have only one cantilever per substrate, which can often
be identified without an optical microscope.
Note: Single crystal silicon substrates are installed face-up so the tip points away
from the AFM cantilever holder. This ensures that the cantilever and tip face
toward the sample once the cantilever holder is mounted on the head.
SIDE VIEW
tip is
installed
BOTTOM VIEW
( TIP SIDE )
no tip
installed
Spring Loaded Probe Clip
Cantilever Probe Tip
( tip faces down )
Cantilever
Mounting
Groove
Electrical Mounting Sockets
( 4 plcs)