B-2
Technical Specifications and Purchased Options
Sample Positioning
Translation
• Standard manual X/Y/theta stage: X Axis,
±
50 mm , Y Axis,
±
50 mm
Computer System
• PC with a Celeron
® or
Semprom
™
processor
• Optional Pentium
®
4 or Athlon
™
processor
• Optional 17 in. flat-panel display
Software
• Dektak 150 software running under Windows XP
• Step Detection software
• Optional Stress Measurement software
• Optional 3-D Mapping software (standard with Y auto stage)
• Other optional software listed in
Vibration Isolation
• Optional vibration isolation table
• Optional table-top vibration isolation platform
Environmental Enclosure
Conductive, tinted, all-acrylic enclosure
PERFORMANCE
Scan Length Range
50 µm to 55 mm (2 mils to 2.16 in.)
Scan Speed Ranges
3 seconds to 200 seconds
Data Points per Scan
60,000 maximum
Maximum Sample Thickness
101 mm (4 in.), depending on Dektak 150 system configuration
Maximum Wafer Size
150 mm (6 in.)
Maximum Sample Weight
3 kg (6.6 lbs)
Vertical Range
524
μ
m (0.02 in.) standard; 1 mm (0.039 in.) optional
Vertical Resolution (at various ranges) 1 Å (@65 kÅ), 10 Å (@655 kÅ), 80 Å (@5240 kÅ); 160 Å (@1 mm)
Stylus Tracking Force
Programmable, 1-15 mg; down to 0.03 with N-
Lite
option
Micro-Form Measurement
Increases accuracy of measurements of difficult shapes and steep
slopes to within 0.25 degrees
Step Height Repeatability
6.0 Å, 1 sigma on 0.1 mm step height
ENVIRONMENT
(For detailed facilities specifications and drawings, see
Power Requirements
Current Phase
100-120~ or 220-240~, 50/60 Hz, 5A@100-120~ or 3A @ 220-240~
(+/-10%)
Single Phase
Power Requirements
Input Voltage
100 to 120VAC/200 to 264VAC, 50 to 60Hz
Warm-up Time
15 min. for maximum stability
Temperature Range
20 to 25º C (68 to 77º F)
Humidity Range
5‘0%, +/-20% non-condensing
DIMENSIONS AND WEIGHT
Profiler Dimensions
292 mm W x 508 mm D x 527 mm H
(11.5 in. W x 20 in. D x 20.75 in. H)
Enclosure Dimensions
L= 28.0 in.(71.1 cm), W = 19.6 in. (49.8 cm), H= 26.0 in. (66.0 cm)
Summary of Contents for Dektak 150
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