Veeco 004-210-000, Instruction Manual

Page: 264 / 358

Electric Force (EFM) Imaging
Electric Field Gradient Detection—Preparation
244 MultiMode SPM Instruction Manual Rev. B
14.3 Electric Field Gradient Detection—Preparation
This section explains how to conduct electric fi eld gradient imaging by applying a voltage to the tip
or sample to generate electric fi elds.
Note: If the sample being imaged has a permanent electric fi eld which does not
require the external application of voltage, the steps below are not required and
you can proceed to
Section 14.4 .
Please consider the following before proceeding:
• Before attempting to recon fi gure the jumpers, carefully read the following Jumper
Con fi guration sections.
• A modi fi ed cantilever is required to bias the tip in EFM. Contact Veeco tech support for
more information.
When it is necessary to apply voltage to the tip or sample, minor changes must be made to the
jumpers in the microscope’s baseplate and the toggle switches on the Basic Extender Module (if
equipped). Original jumper con
fi gurations and jumper changes are dependent on the microscope
being used and the measurements desired. Section 14.3.1 provides jumper con fi guration
instructions for basic microscope models operating without the Basic Extender Module in four
sections:
• “Voltage Applied to the Tip” on page 246
• “Voltage Applied to the Sample” on page 248
• “External Voltage Source Applied to the Tip” on page 249
• “External Voltage Source Applied to the Sample” on page 250
Section 14.3.2 provides jumper con fi guration instructions for basic microscope models operating
with the Basic Extender Module in four sections:
• “Voltage Applied to the Tip” on page 252
• “Voltage Applied to the Sample” on page 253
• “External Voltage Source Applied to the Tip” on page 254
• “External Voltage Source Applied to the Sample” on page 255
The location and orientation of the jumpers in the baseplate of the MultiMode is shown below in
Figure 14.3a . To change the jumpers, it should not be necessary to remove the baseplate; they can
easily be changed through the rectangular opening in the bottom of the baseplate using a pair of
non-conducting tweezers. For non-EFM applications and surface potential operation, jumpers are
usually left in their original positions or returned to their original positions.