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7.1
Test Setup Block Diagram
TSW3000
EVM DUT
J7
Clock
Power
Supply
GND
+6 V
16
25
J9
Pattern
Generator
16
J17 J11
PC Controller
J14
J13
J1
Spectrum
Analyzer
7.2
Test Equipment
7.3
Calibration
7.4
Test Specifications
Demo Kit Test Configuration
The test set up for general testing of the TSW3000 Demo Kit is shown in
Figure 8. Test System Block Diagram
The following is a list of the test equipment required for testing the TSW3000 Demo Kit. Equivalent models
may be used for certain applications, but may produce different results due to limitations within the
instrument.
•
Dual Power Supply: Any with current readout capability
•
Spectrum Analyzer: Rhode & Schwartz FSU, Agilent PSA, or equivalent
This particular piece can measure >70-dBc ACPR with the noise cancellation option active. This
amount of dynamic range is required to accurately measure the ACPR of the Demo Kit. Another
spectrum analyzer can be substituted if it achieves as good or better dynamic range.
•
Pattern Generator: Agilent 16702B
•
Oscilloscope: Tektronix 650 or equivalent
Used to probe clock output signals and for debugging.
•
Digital Voltmeter: Agilent 34401A or equivalent
In order to record proper output power the insertion loss of the output cable must calibrated. Measure the
insertion loss of the cable from J9 to the spectrum analyzer; set the analyzer's reference level offset to
that value.
The test specifications are outlined in
.
Table 5. Demo Kit Specifications
MIN
MAX
UNITS
CURRENT
+6 V
1.5
A
CW TESTS
Carrier suppression
30
dBc
18
SLWU013A – March 2004 – Revised September 2005
