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Connector and Test Point Descriptions
5
SNVU588 – November 2017
Copyright © 2017, Texas Instruments Incorporated
TPS40345EVM-353 Evaluation Module
4
Connector and Test Point Descriptions
4.1
Enable Jumper (JP2)
The TPS40345EVM-353 is designed with a Disable Jumper (JP2) using a 0.1-inch spacing header and
shunt. Installing a shunt in the JP2 position connects the EN/SS pin to GND, discharges the soft-start
capacitor, and disables the TPS40304 controller. This forces the output into a high-impedance state
(approximately 20k
Ω
to GND).
4.2
Frequency Spread Spectrum – FSS Jumper (JP1)
The TPS40345EVM-353 is designed with a frequency spread spectrum (FSS) enable jumper (JP1) using
a 0.1" spacing header and shunt. Installing a shunt in the JP1 position connects the EN/SS pin to BP via a
267-k
Ω
resistor (R10) to enable frequency spread spectrum.
FSS modulates the switching frequency to ±10% of the nominal value at 30 kHz to reduce EMI at the
switching frequency and its harmonics, however there may be a 30-kHz component to the output ripple
(see
).
The TPS40345EVM-353 does not dynamically monitor the JP1 status for programming FSS. The
TPS40345EVM-353 must be disabled via JP2 or powered down by reducing VIN to less than 3 V to
remove or install JP1.
4.3
Test Point Descriptions
Table 2. Test Point Descriptions
TEST
POINT
LABEL
USE
SECTION
TP1
VIN
Measurement test point for input voltage
4.3.1
TP2
GND
Ground test point for input voltage
4.3.1
TP3
VOUT
Measurement test point for output voltage
4.3.1
TP4
GND
Ground test point for output voltage
4.3.2
TP5
CHB
Measurement test point for channel B of loop response
4.3.3
TP6
SGND
Ground test point for channel B of loop response
4.3.3
TP7
CHA
Measurement test point for channel A of loop response
4.3.3
TP8
SGND
Ground test point for channel A of loop response
4.3.3
TP9
SGND
Ground test point for error amplifier measurements
4.3.4
TP10
COMP
Measurement test point for error amplifier output voltage
4.3.4
TP11
FB
Measurement test point for error amplifier input voltage
4.3.4
TP12
HDRV
Measurement test point for high-side gate driver voltage
4.3.5
TP13
SW
Measurement test point for switching node voltage
4.3.5
TP14
LDRV
Measurement test point for low-side gate driver voltage
4.3.5
TP15
PGND
Ground test point for switch node and gate drive voltages
4.3.5
TP16
PGOOD
Measurement test point for power good
4.3.6
TP17
EN/SS
Measurement test point for enable / soft start
4.3.7
TP18
SGND
Ground test point for power good and enable / soft start
4.3.6 and 4.3.7