Test Setup and Procedures
7
SLUUCB4 – June 2020
Copyright © 2020, Texas Instruments Incorporated
TPS25980EVM: Evaluation Module for TPS25980x efuse
5.1
Hot-Plug Test
Use the following instructions to measure the inrush current during Hot-Plug event:
1. For checking inrush current control capability, insert additional capacitance of 1800 uF at C16
terminals. Total output capacitance = 1800 uF + 220 uF ~2 mF.
2. Set Jumper J12 in 3-4 position to set Cdvdt at 10 nF for o/p slew rate of 0.5 V/ms.
3. Set the input supply voltage VIN to 12 V and current limit of 5 A. Enable the power supply.
4. Hot-plug the supply between input connectors J1 and J3.
5. Observe the waveform at VOUT (TP2) with an oscilloscope to measure the slew rate and rise time of
the eFuse with a given input voltage of 12 V.
shows an example of inrush current captured on the TPS25980EVM eFuse Evaluation Board.
Figure 3. TPS259804O Output Rise Profile (VIN = 12 V, CdVdT = 10 nF, COUT = 2 mF, No-load)