Texas Instruments TPD2E2U06-Q1EVM, User Manual

Page: 1 / 13

User's Guide
SLVUAC6 – December 2014
TPD2E2U06-Q1EVM
This user's guide describes the characteristics, operation, and use of the TPD2E2U06-Q1EVM evaluation
module (EVM). This EVM includes 7 TPD2E2U06-Q1’s in various configurations for testing. Five
TPD2E2U06-Q1’s are configured for IEC61000-4-2 compliance testing, one TPD2E2U06-Q1 is configured
for 4-port s-parameter analysis, and one is configured for throughput with USB 2.0 Type A connectors.
Additionally, one of the TPD2E2U06-Q1’s for ESD testing also allows the capture of a clamping waveform
during an ESD event. This user's guide includes setup instructions, schematic diagrams, a bill of
materials, and printed-circuit board layout drawings for the evaluation module.
1 Introduction
Texas Instrument’s TPD2E2U06-Q1 evaluation module helps designers evaluate the operation and
performance of the TPD2E2U06-Q1 device. The TPD2E2U06-Q1 is a dual channel ESD protection device
in a small DBZ package which offers IEC61000-4-2 Level 4 compliant ESD protection. The 1.5 pF line
capacitance is suitable for a wide range of applications. The TPD2E2U06-Q1 is characterized for
operation over an ambient air temperature range of -40°C to 125°C.
The EVM contains seven TPD2E2U06-Q1’s. A single TPD2E2U06-Q1 (U1) is configured with two USB2.0
Type A female connectors (J5 & J6) for capturing Eye Diagrams. The data lines are connected to
TPD2E2U06-Q1’s IO protection pins. A single TPD2E2U06-Q1 (U2) is configured with 4 SMA (J1 – J4)
connectors to allow 4-port analysis with a vector network analyzer. Five TPD2E2U06-Q1’s (U3 – U7) are
configured with test points for striking ESD to the protection pins, one of those (U6) also has an SMB (J7)
connector for capturing clamping waveforms with an oscilloscope during an ESD strike. Caution must be
taken when capturing clamping waveforms during an ESD event so as not to damage the oscilloscope. A
proper procedure is outlined below in
Section 3.4 .
Table 1. EVM Configuration
Reference Designator TI Part Number Configuration
U1 TPD2E2U06-Q1 USB 2.0 Eye Diagram
U2 TPD2E2U06-Q1 S-parameters
U3 – U7 TPD2E2U06-Q1 IEC61000-4-2 ESD Tests
U6 TPD2E2U06-Q1 ESD Clamping waveforms
2 DEFINITIONS
Contact Discharge — a method of testing in which the electrode of the ESD simulator is held in contact
with the device-under-test (DUT).
Air Discharge — a method of testing in which the charged electrode of the ESD simulator approaches
the DUT, and a spark to the DUT actuates the discharge.
ESD simulator — a device that outputs IEC61000-4-2 compliance ESD waveforms shown in Figure 1
with adjustable ranges shown in Table 2 and Table 3 .
IEC61000-4-2 has 4 classes of protection levels. Classes 1 – 4 are shown in Table 2 . Stress tests
should be incrementally tested to level 4 as shown in Table 3 until the point of failure. If the DUT
does not fail at 8 kV, testing can continue in 2 kV increments until failure.
1 SLVUAC6 – December 2014 TPD2E2U06-Q1EVM
Submit Documentation Feedback
Copyright © 2014, Texas Instruments Incorporated