Texas Instruments TPD2E1B06DRLEVM, User Manual, Page: 1 / 12

User's Guide
SLVU917 – August 2013
TPD2E1B06DRLEVM
This user's guide describes the characteristics, operation, and use of the TPD2E1B06DRLEVM evaluation
module (EVM). This EVM includes 7 TPD2E1B06DRL’s in various configurations for testing. Five
TPD2E1B06DRL’s are configured for IEC61000-4-2 compliance testing, one TPD2E1B06DRL is
configured for 4-port s-parameter analysis, and one is configured for throughput on USB 2.0 Type A
connectors for throughput analysis. Additionally, two of the TPD2E1B06DRL’s for ESD testing also allow
the capture of clamping waveforms during an ESD event. This user's guide includes setup instructions,
schematic diagrams, a bill of materials, and printed-circuit board layout drawings for the evaluation
module.
1 INTRODUCTION
Texas Instrument’s TPD2E1B06DRL evaluation module helps designers evaluate the operation and
performance of the TPD2E1B06DRL device. The TPD2E1B06DRL is a dual channel ESD protection
device in a small DRL package which offers IEC61000-4-2 Level 4 compliant ESD protection. The 1 pF
line capacitance is suitable for a wide range of applications. The TPD2E1B06DRL is characterized for
operation over an ambient air temperature range of -40°C to 125°C.
The EVM contains seven TPD2E1B06DRL’s. A single TPD2E1B06DRL (U1) is configured with two
USB2.0 Type A female connectors (J5 & J6) for capturing Eye Diagrams. The data lines are connected to
TPD2E1B06DRL’s IO protection pins. A single TPD2E1B06DRL (U2) is configured with 4 SMA (J1 – J4)
connectors to allow 4-port analysis with a vector network analyzer. Five TPD2E1B06DRL’s (U3 – U7) are
configured with test points for striking ESD to the protection pins, two of those (U5 & U6) also have SMB
(J7 & J8) connectors for capturing clamping waveforms with an oscilloscope during ESD test. Caution
must be taken when capturing clamping waveforms during an ESD event so as not to damage the
oscilloscope. A proper procedure is outlined below in
Section 3.4 .
Table 1. EVM Configuration
Reference Designator TI Part Number Configuration
U1 TPD2E1B06DRL USB 2.0 Eye Diagram
U2 TPD2E1B06DRL S-parameters
U3 – U7 TPD2E1B06DRL IEC61000-4-2 ESD Tests
U5 & U6 TPD2E1B06DRL ESD Clamping waveforms
2 DEFINITIONS
Contact Discharge — a method of testing in which the electrode of the ESD simulator is held in contact
with the device-under-test (DUT).
Air Discharge — a method of testing in which the charged electrode of the ESD simulator approaches
the DUT, and a spark to the DUT actuates the discharge.
ESD simulator — a device that outputs IEC61000-4-2 compliance ESD waveforms shown in Figure 1
with adjustable ranges shown in Table 2 and Table 3 .
IEC61000-4-2 has 4 classes of protection levels. Classes 1 – 4 are shown in Table 2 . Stress tests
should be incrementally tested to level 4 as shown in Table 3 until the point of failure. If the DUT
does not fail at 8kV, testing can continue in 2 kV increments until failure.
1 SLVU917 – August 2013 TPD2E1B06DRLEVM
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