Texas Instruments LMR36503RFEVM, User Manual, Page: 3 / 15

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Setup
3 SNVU672 – February 2020
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LMR36503RFEVM User’s Guide
1 Setup
This section describes the test points and connectors on the EVM and how to properly connect, set up,
and use the LMR36503RFEVM.
1.1 Test Points
The test points on the top of the board can be used for connecting to the input and output of the EVM.
See
Figure 2 for typical test setup. The functions of the test points connections are:
• VIN_EMI — Input supply to EVM including an EMI filter. Connect to a suitable input supply. Connect at
this point for conducted EMI test.
• GND — Ground connection for the input supply as well as test points for ground connection
• VIN — Input supply to the IC. Can be connected to DMM to measure input voltage after EMI filter
• VOUT — Output voltage test point of EVM. Can be connected to a desired load
• EN — This test point is connected to the EN pin. By default, there is a pullup resistor R2 (RENT) to
VIN to enable the IC.
• PGOOD — This test point is connected to the PGOOD pin from the IC. It is an open-drain output of the
PGOOD pin. Can be tied to external supply through a pullup resistor or left open
• SYNC — In a MODE/SYNC trim part, this test point is connected to the SYNC pin of the IC. Can be
connected to an external clock to synchronize the IC. Make sure R4 (RMODE) is installed and R5 (RT)
is not installed. In a
RT trim part, this test point is connected to the RT pin of the IC when the R4
(RMODE) is installed.
• VCC — This test point is connected to the VCC pin.
• SW — This test point is connected to the switch node.
Figure 2. EVM Board Connections