Debug Probes Hardware and Software
15
SLAU647L – July 2015 – Revised February 2018
Copyright © 2015–2018, Texas Instruments Incorporated
MSP Debuggers
5.6
MSP-FET Stand-Alone Debug Probe
The MSP-FET (see
and
) is a powerful debug probe for application development
supporting all MSP430 microcontrollers.
The MSP-FET provides a USB interface to program and debug the MSP430 devices in-system through
the JTAG interface or the pin-saving Spy-Bi-Wire (2-wire JTAG) protocol. Furthermore, the USB interface
can be used for Backchannel UART and MSP target BSL communication. UART BSL and I
2
C BSL
communication modes are supported.
The MSP-FET development tool supports development with all MSP430 devices and is designed for use
with PCBs that contain MSP430 devices; for example, the MSP430 target socket boards.
Figure 10. MSP-FET Top View
Figure 11. MSP-FET Bottom View
5.6.1
General Features
The MSP-FET debug probe includes the following features:
•
MSP-FET first generation (v1.2):
–
Has no CE sticker or label on the case, and no W at the end of the version number
–
Is supported since:
•
CCS v6.0.0
•
IAR EW430 v5.60.7 and IAR EWARM v6.10.1
•
MSP-FET second generation (v2.04, v2.05, and v2.06):
–
Has a CE sticker or label on the case, or a W at the end of the version number
–
Is supported since:
•
CCS v7.0
•
IAR EW430 7.1 and IAR EWARM 8.10
•
Operating systems: OS X, Linux, Windows
•
Software configurable supply voltage between 1.8 V and 3.6 V at 100 mA
NOTE:
The MSP-FET supply voltage is generated by an DC/DC converter, which creates a voltage
ripple on the target supply line. This ripple can affect the performance of the analog modules
of the MSP device (for example, the ADC and the DAC). If necessary, connect an low-ripple
external power supply to the target application.
•
External voltage detection
•
Supports JTAG security fuse blow to disable debugging
•
Supports all MSP430 boards with JTAG header
•
Supports both JTAG and Spy-Bi-Wire (2-wire JTAG) debug protocols
