Texas Instruments DS250DF230EVM, User Manual, Page: 22 / 31

Test Case Examples
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22 SNLU238A – August 2018 – Revised September 2019
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DS250DF230EVM User’s Guide
4 Test Case Examples
The following is an example test case with results collected using this EVM.
• Data Rate : 25.78125Gbps
• Data pattern : PRBS31
• Backplane insertion loss : -35dB @ 12.9GHz
• Crosstalk at victim RX : 4.1 mV RMS (24.1 mVppd)
• Victim TX amplitude : 1200mVppd
• Victim TX FIR : C(-1)=-4, C(0)=24, C(+1)=-3
• Adapt mode : 2
• Adapted RX CTLE : [3,0,0,0]
• Adapted DFE : [-0x14, +0x2, +0x1, -0x2, 0x0]
Figure 20. SDD21 Loss Characteristic of Example Test Case
Results:
• Error count = 0, BER < 1E-13
• Horizontal eye opening (HEO): 0.44UI @ 1.5E-5
• Vertical eye opening (VEO): 190mV @ 1.5E-5
5 Supplemental Documents
All the EVM design, layout, and other files which are relevant to this EVM are listed below:
FILE DESCRIPTION FILE NAME
Schematic PDF HSDC006_DS250DF230EVM_schematic.pdf
Board layout file DS250DF230EVM_PCB_LAYOUT.brd
Board Gerbers DS250DF230EVM_GERBERS.zip
Board s-parameters folder EVM/s_parameters/