EVM Hardware Overview
3.6
EVM Features
This evaluation platform has an output protection circuit designed to withstand the electrostatic discharge
(ESD), electrically fast transient (EFT), conducted immunity (CI), and radiated immunity (RI) immunity
tests as described by the IEC61000-4 test suite. For full details concerning the design of these circuits and
the design considerations for the layout of this PCB, please refer to
.
Figure 6. Hardware Features
8
DACx760EMC-EVM
SBAU229 – April 2014
Copyright © 2014, Texas Instruments Incorporated
