6.6 Electrical Characteristics: Current Output
at 1.7 V ≤ V
DD
≤ 5.5 V, ±250-µA output range, digital inputs at VDD or AGND, and all minimum and maximum specifications
at –40°C ≤ T
A
≤ +125°C and typical specifications at T
A
= 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
STATIC PERFORMANCE
Resolution
8
Bits
INL
Integral nonlinearity
DAC codes between 0d and 255d
–1
1
LSB
DNL Differential nonlinearity
DAC codes between 0d and 255d
–1
1
LSB
Offset error
DAC at midscale
±1
%FSR
Gain error
DAC codes between 0d and 255d
±1.3
%FSR
OUTPUT
Output compliance voltage
To V
DD
and A
GND
400
mV
Z
O
I
OUT
dc output impedance
DAC at midscale, DAC output kept at V
DD
/2
60
MΩ
Power supply rejection ratio
(dc)
DAC at midscale, all bipolar ranges, V
DD
changed from
4.5 V to 5.5 V
0.23
LSB/V
DYNAMIC PERFORMANCE
t
sett
Output current settling time
1/4 to 3/4 scale and 3/4 to 1/4 scale settling to 1 LSB
at 8-bit resolution, V
DD
= 5.5 V, common-mode voltage
at OUTx pin is V
DD
/2
60
µs
V
n
Output noise current (peak to
peak)
0.1 Hz to 10 Hz, DAC at midscale,
V
DD
= 5.5 V, ±250-µA output range
150
nA
PP
Output noise density
f = 1 kHz, DAC at midscale,
V
DD
= 5.5 V, ±250-µA output range
1
nA/√Hz
Power supply rejection ratio
(ac)
±250-µA output range, 200-mV 50-Hz or 60-Hz sine
wave superimposed on power-supply voltage, DAC at
midscale
0.65
LSB/V
POWER
I
DD
Current flowing into VDD
Normal operation, DACs at full scale, ±25-µA output
range, digital pins static
42
50
µA/ch
Normal operation, DACs at full scale, ±50-µA output
range, digital pins static
56
70
Normal operation, DACs at full scale, ±125-µA output
range, digital pins static
98
120
Normal operation, DACs at full scale, ±250-µA output
range, digital pins static
167
200
(1)
Measured between DAC codes 0d and 255d.
(2)
Specified by design and characterization, not production tested.
(3)
The current flowing into V
DD
does not account for the load current sourced or sinked on the OUTx pins. The VREF pin is connected to
V
DD
.
(4)
The total power consumption is calculated by I
DD
x (total number of channels powered on) + (sleep-mode current).
SLASF47 – MAY 2022
Copyright © 2022 Texas Instruments Incorporated
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