Texas Instruments bq501210, User Manual, Page: 4 / 29

Connector and Test Point Descriptions
www.ti.com
4 SLVUAO6 – June 2016
Submit Documentation Feedback
Copyright © 2016, Texas Instruments Incorporated
bq501210 bqTESLA™ Wireless Power TX EVM
4.2 Test Point Descriptions
The test points are described in Section 4.2.1 through Section 4.2.25 .
4.2.1 TP1 – FP_GAIN
FOD ping calibration gain setting, see the data sheet for more information.
4.2.2 TP2 – Drive A
Output from power section A of H-Bridge, U2.
4.2.3 TP3 – Coil Monitor L / C
Coil signal at junction between transmitter coil and resonant capacitors.
4.2.4 TP4 – Low Noise Analog Ground
Low noise ground test point (TP).
4.2.5 TP5 – Low Noise Analog Ground
Low noise ground TP.
4.2.6 TP6 – PEAK_DET
Peak detect circuit - input to PEAK_DET of bq501210.
4.2.7 TP7 – Demodulation Comm + Output
Primary communications channel, input to , , and of bq501210, U1 from
demodulation circuit.
4.2.8 TP8 – I_Sense
Input current-sense voltage, scale 1 V = 1 A.
4.2.9 TP9 – RAIL+
Sample voltage from rail converter output, input to bq501210 rail control circuit.
4.2.10 TP10 – Proprietary Packet
RX_PROP indicates RX proprietary packet received.
4.2.11 TP11 – V33FB
Reserved, leave this pin open.
4.2.12 TP12 – Low Noise Analog Ground
Low noise ground TP.
4.2.13 TP13 – Debug only
TX_COMM is used for debug only. This pin echoes all TX_COMM.
4.2.14 TP14 – FP_OFFSET
FOD ping circuit setting, see the data sheet for more information.