bq3050 Circuit Module Schematic
2.2
Pin Descriptions
PIN NAME
DESCRIPTION
1N
–
ve connection of first (bottom) cell
1P
+ve connection of first (bottom) cell
2P
+ve connection of second cell
3P
+ve connection of third cell
4P
+ve connection of fourth (top) cell
SMBC
Serial communication port clock
SMBD
Serial communication data port
VSS
Pack negative terminal
PACK
–
Pack negative terminal
SYS PRES
System present pin (if low, system is present)
PACK+
Pack positive terminal
3
bq3050 Circuit Module Schematic
This section contains information on the schematic for the bq3050/bq29440 implementation.
3.1
Schematic
The schematic follows the bill of materials in this user's guide.
3.2
Choosing Particular Precharge Mode
The bq3050 contains an internal precharge FET; however, the default firmware configuration uses the
Charge FET for precharge. To evaluate the internal precharge FET, change the least two significant bits in
DF:Configuration:Charging Configuration to be 0,0. See the bq3050 Technical Reference Manual
(
) for additional information.
3.3
Testing Fuse-Blowing Circuit
To prevent the loss of board functionality during the fuse-blowing test, the actual chemical fuse is not
provided in the circuit. FET Q1 drives TP8 low if a fuse-blow condition occurs; monitoring TP8 can be
used to test this condition.
4
Circuit Module Physical Layouts and Bill of Materials
This section contains the board layout, bill of materials, and assembly drawings for the bq3050/bq29440
circuit module.
4.1
Board Layout
This section shows the dimensions, PCB layers, and assembly drawing for the bq3050 module.
3
SLUU532A
–
November 2011
–
Revised December 2011 bq3050EVM SBS 1.1 Compliant Advanced Gas Gauge Battery Management
Solution EVM
Copyright
©
2011, Texas Instruments Incorporated
