7 Test Pattern
It is often useful to utilize test patterns to help verify the correct reciept of digital data at the microcontroller or
FPGA. A ramp pattern can be enabled by following these steps:
• Click the yellow button "Analog Inputs and Clk"
• Next to "Test Pattern CHA", click the drop down menu, and select "RAMP CUSTOM". This can be done for
"Test Pattern CHB" as well.
• In the field next to "Custom Pattern", enter the number "16".
• The digital ramp pattern is now enabled on the ADC. The output of the ADC is now a 14 bit, incrementing
ramp pattern.
Figure 7-1. ADC35XXEVM GUI 1.0 Ramp Pattern
Test Pattern
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ADC364xEVM Evaluation Module
SBAU232 – OCTOBER 2020
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