Software Control
17
SLAU579D – June 2014 – Revised August 2018
Copyright © 2014–2018, Texas Instruments Incorporated
ADC3xxxEVM and ADC3xJxxEVM
2.2.1.2
ADC32xx Tab
illustrates the following parts of the ADC32xx tab.
•
Disable Dither CHA – disables the dither circuit, if asserted, dither is on by default
•
Disable Dither CHB – disables the dither circuit, if asserted, dither is on by default
•
CHA PwDn – power down CHA
•
CHB PwDn – power down CHB
•
CHA Gain Enable – enable the digital gain block for CHA
•
CHB Gain Enable – enable the digital gain block for CHB
•
Gain CHA – digital gain setting from 0 dB to 6 dB
•
Gain CHB – digital gain setting from 0 dB to 6 dB
•
Enable Test Pattern – enable the use of test patterns instead of sample data
•
Align Test Data – align all test data on the outputs
•
Test Pattern CHA – different available test patterns
•
Test Pattern CHB – different available test patterns
•
Custom Pattern – 14-bit custom bit pattern used when
Custom Pattern
is selected
•
Disable Chopper CHA – disable the chopper function which shifts 1/f nose to Fs/2, by default it is on
•
Disable Chopper CHB – disable the chopper function which shifts 1/f nose to Fs/2, by default it is on
•
Low Freq Mode – enable for sampling frequencies lower than 35 MHz
•
OVR on LSB – over range indication on LSB, by default it is normal LSB function
•
LVDS Swing – control the LVDS swing on the LVDS signals
Figure 11. ADC32xx Tab
