Sun Microsystems Netra CT 820, Service Manual

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4-4 Netra CT 820 Server Service Manual • July 2004
4.1.10 FRUID Checksum Test
The FRUID Checksum test traverses through all available FRU devices on the Netra
CT 820 server and checks for their FRU data. It reads the FRU buffer for each
available FRU device, computes its checksum and compares that with the checksum
that is read from the FRU device, then reports a pass or failure status. This test will
loop up to four retries when it fails to read the requested FRU data, in accordance
with the PICMG IPMI Specification.
The FRUID Checksum test that is run from the active DMC card runs the test on all
available FRU devices on the Netra CT 820 server except the standby DMC card. The
The FRUID Checksum test that is run from the standby DMC card runs the test on
only the standby DMC card.
4.1.10.1 Midplane FRU Devices
There are two midplane FRU devices:
■
The IPMI type FRU, which has five segments— the Header Area, the Internal Info
Area, the Chassis Info Area, the Board Info area, and the Product Info area. The
FRUID Checksum test checks and validates all of these segments.
■
The SunFRU, which consists of one segment.
4.1.10.2 DMC FRU Devices
There are two DMC FRU devices, both using the Sun FRU format and each with one
segment:
■
The active DMC FRU, which performs the FRUID checksum test on the active
DMC card.
■
The standby DMC FRU, which performs the FRUID checksum test on the standby
DMC card.
4.1.10.3 Fan Tray FRU Devices
There are three fan tray FRU devices and all three have IPMI type FRU devices. Each
fan tray FRU has four segments—the Header Area, the Internal Info Area, the Board
Info Area and the Product Info Area. This test checks all four of these segments.