STMicroelectronics SPC570SADPT64S rev. B, User Manual

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5.5 Test points
Several test points of different shape and functionality are scattered around the SPC570SADPT64S Rev. B
evaluation board to allow easy access to MCU and reference signals. This chapter summarizes and describes the
available test points. Test points are listed and detailed in the following
Table 10 :
Table 10. Test points
Test
point
Description Position
GT1 GND test point Figure 10 – A4
GT2 GND test point Figure 10 – D4
GT3 GND test point Figure 10 – C2
GT4 GND test point Figure 10 – A1
GT5 GND test point Figure 10 – D1
TP3 TCK test point (JTAG) Figure 10 – A1
TP4 TMS test point (JTAG) Figure 10 – A1
TP5 TDI test point (JTAG) Figure 10 – A2
TP6 TDO test point (JTAG) Figure 10 – A1
TP11 J23A, QSH connector, pin10 (PA[5]) test point Figure 10 – A4
TP16 J23A, QSH connector, pin19 (PA[14]) test point Figure 10 – B4
TP17 J24B, QSH connector, pin210 (PD[6]) test point Figure 10 – D1
TP18 J24B, QSH connector, pin209 (PD[7]) test point Figure 10 – D1
TP19 J24B, QSH connector, pin183 (PF[13]) test point Figure 10 – C1
UM2841
Test points
UM2841 - Rev 1
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