– 116 –
Pin No.
Pin Name
I/O
Function
51
DB0
I/O
External RAM data terminal
Data bus 0
52
VDD
—
Power supply (+5 V)
53
GND
—
Ground (0 V)
54
TI1
I
For IC test Normally connected to VDD
55
VIN
I
VCXO input
56
VOUT
O
VCXO output
57
T12
I
IC test pin
Normally connected to ground (or no connection)
58
T13
I
IC test pin
Normally connected to ground (or no connection)
59
TLDB
I
IC test pin
Normally connected to ground (or no connection)
60
TCK
I
IC test pin
Normally connected to ground (or no connection)
61, 62
NC
—
Not used
63
PDO
O
Phase comparator output
(3-state)
64
T14
I
IC test pin
Normally connected to ground (or no connection)
65
PDDIS
I
IC test pin
Normally connected to ground (or no connection)
66
MUTO
O
Muting output
“H”: mute
67
T15
I
IC test pin
Normally connected to ground (or no connection)
68, 69
NC
—
Not used
70
DAOUT
O
DIGITAL OUT output (serial data stream output)
71
NC
—
Not used
72
DASEL
I
DIGITAL OUT selection
73
T18
I
IC test pin
Normally connected to ground (or no connection)
74 to 77
NC
—
Not used
78
MUTI
I
Muting input
“H”: mute
79
VDD
—
Power supply (+5 V)
80
GND
—
Ground (0 V)
81
AVDD
—
Power supply for analog comparator (+5 V)
82
CPIN
I
Analog comparator input
Positive side (non-inverted side : OPSK input)
83
CMIN
I
Analog comparator input
Negative side (inverted side)
84
AGND
—
Ground for Analog comparator (0 V)
85
TM4
I
IC test pin
Normally connected to ground (or no connection)
86
VDD
—
Power supply (+5 V)
87
DIN
I
IC test pin
Normally connected to ground (or no connection)
Analog comparator output
Analog comparator outputNot usedInverted output
Not used
Ground ( 0 V)
Not used
I
IC test pin
Normally connected to ground (or no connection)
I
IC test pin
Normally connected to ground (or no connection)
Ground for 46.08 MHz oscillator (0 V)
Power supply for 46.08 MHz oscillator (+5 V)
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