Sejin Electron SKR-2006, User Manual, Page: 5 / 9

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Shield Shield Fram GND
6.2 Connector Schematics
7.0 CHATTERING AND BOUNCE
Operation force shall be applied according to the normal operating method at 5V DC,
5mA.There shall be no bounce and chattering within 10msec when it is measured using a
specially prepared tester or a synchroscope.
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Chattering and bounce are defined in the following diagram :
8.0 TEMPERATURE AND HUMIDITY
12.0.1 Based on laboratory test conditions, there shall be no electrical or
mechanical damage to the keyboard as a result of the following tests.
12.1 Operating
12.1.1 The keyboard will be capable of withstanding 10 to 40 degrees C with a 40
degree C maximum wet bulb temperature (20% to 95%max. relative humidity
non condensing) cycled for 10 days.
12.2 Storage
12.2.1 The keyboard will be capable of withstanding a temperature of -20 degrees
C to +60 degrees C with a 48 degree C maximum wet bulb temperature(90%
max. humidity non condensing)cycled for ten days.
9.0 DROP TEST(NON-OPERATION)
Purpose of test: To verify the keyboard’s ability to withstand being dropped from lap and desk
heights.
Test Parameters/Conditions: 25°C @ 50% R.H.
Standard: After test, If the keyboard is recoverable(able to be re- assembled), it is
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5 PIN DIN 6 PIN