Seagate ST9100011FS, Product Manual

Page: 26 / 52

20 Pulsar.2 Product Manual, Rev. A
2.12 Reliability
2.12.1 Annualized Failure Rate (AFR) and Mean Time Between Failures (MTBF)
The product shall achieve an Annualized Failure Rate - AFR - of 0.44%. AFR and MTBF are population statis-
tics that are not relevant to individual units.
AFR and MTBF specifications are based on the following assumptions:
• 8760 power-on-hours per year.
• 250 average power cycles per year.
• Operations at nominal voltages.
• Systems will provide adequate cooling to ensure the case temperatures do not exceed specification.
2.12.2 Reliability specifications
Unrecoverable read error rate during 1 LBA per 10
16
bits read, max
Annualized Failure Rate (AFR) 0.44%
Power cycles 50,000 cycles
(at nominal voltage and temperature, with 60 cycles per hour and a 50%
duty cycle)
Warranty To determine the warranty for a specific drive, use a web browser to
access the following web page:
support.seagate.com/customer/warranty_validation.jsp
You will be asked to provide the drive serial number, model number (or
part number) and country of purchase. After submitting this information,
the system will display the warranty information for your drive.
Preventive maintenance None required.
Typical Data Retention with Power removed
(at 40°C)
3 months [1]
Endurance Method 1: 10 Drive Writes per Day [2]
Method 2: TBW (per JEDEC JESD218)
400GB = 8800TB
200GB = 4400TB
100GB = 2200TB
[1] As NAND Flash devices age with use, the capability of the media to retain a programmed value begins to
deteriorate. This deterioration is affected by the number of times a particular memory cell is programmed
and subsequently erased. When a device is new, it has a powered off data retention capability of up to ten
years. With use the retention capability of the device is reduced. Temperature also has an effect on how
long a Flash component can retain its programmed value with power removed. At high temperature the
retention capabilities of the device are reduced. Data retention is not an issue with power applied to the
SSD. The SSD drive contains firmware and hardware features that can monitor and refresh memory cells
when power is applied.
[2] Endurance is the expected write life of a product when subjected to a specified workload. The drive will
support the end user writing the specified multiple of drive user capacity to the drive per day for the
expected life of the product. This value is based on randomly writing 4KB transfers aligned on 4KB
boundaries across the entire drive LBA range. For example a 200GB drive could be written to up to
(n*200GB) of user data per day for the product life.