SAFEASSURE FRDMGD3160DCMHB, Manual

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NXP Semiconductors
UM11637
FRDMGD3160DCMHB evaluation board
Pin Name Function
15 INTAL fault reporting and real time V
CE
and VGE monitoring (low side)
16 MOSIH master out slave in (high side)
17 INTAH fault reporting and real time V
CE
and VGE monitoring (high side)
18 CSBH chip select bar (high side)
19 n.c. not connected
20 AOUTH duty cycle encoded signal (high side)
21 PWMH PWM input (high side)
22 FSSTATEH fail-safe state (high side)
23 GND ground
24 INTBH interrupt bar (high side)
Table 2. Low-voltage domain 24-pin connector definitions
...continued
4.4.2 Test point definitions
All test points are clearly marked on the evaluation board. Figure 4 shows the location of
various test points.
Figure 4. Key test point locations
UM11637 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2022. All rights reserved.
User guide Rev. 2 — 3 February 2022
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