GUI Reference
R&S
®
CMW-KM750/-KM751
42
User Manual 1173.9670.02 ─ 05
Measure on Exception
Specifies whether measurement results that the R&S
CMW identifies as faulty or inac-
curate are rejected. A faulty result occurs e.g. when an overload is detected. In remote
control, the cause of the error is indicated by the "reliability indicator".
●
Off:
Faulty results are rejected. The measurement is continued; the statistical coun-
ters are not re-set. Use this mode to ensure that a single faulty result does not affect
the entire measurement.
●
On:
Results are never rejected. Use this mode e.g. for development purposes, if you
want to analyze the reason for occasional wrong transmissions.
Remote command:
Power vs Time / Modulation / Spectrum / BER > Statistic Count
Defines the number of measurement intervals per measurement cycle (statistics cycle,
single-shot measurement). This value is also relevant for continuous measurements,
because the averaging procedures depend on the statistic count.
In the TD-SCDMA multi evaluation measurement, the measurement interval is completed
when the R&S
CMW has measured the full subframe sequence ("No. of Subframes").
The measurement provides independent statistic counts for the modulation results, the
spectrum results and the power vs. time results. In single-shot mode and with a shorter
spectrum statistic count, the ACLR evaluation is stopped while the R&S
CMW still con-
tinues providing new modulation results.
See also: "Statistical Results" in the R&S CMW user manual, chapter "System Overview"
Remote command:
Power vs Time > Two Shot Assembly Level
Enables or disables the two-shot measurement mode for high dynamic range and defines
an assembly level for the two consecutive measurement results.
In the two-shot measurement the multislot range is measured in two frames using two
different "Expected Nominal Power" settings. The results of the two stages are combined
and displayed together in the "Power vs. Time" diagram.
The two maximum levels differ by 30 dB, which means that – depending on the level
range of the UE under test and the external test setup – a gain in dynamic range up to
30 dB can be achieved. The two stage measurement ensures a sufficient dynamic range
for arbitrary slot powers but increases the measurement time by a factor of 2.
The assembly level is defined as signal level relative to the reference level (the "Expected
Nominal Power" plus the "User Margin") where the two results obtained in a two stage
measurement are joined together: All trace points above the assembly level are obtained
with a large "Expected Nominal Power", the ones below are measured with lower "Expec-
ted Nominal Power".
Parameters and Settings
