Philips 74F257A, Datasheet

Page: 5 / 8

Philips Semiconductors Product specification
74F257A
Quad 2-line to 1-line selector/multiplexer, non-inverting
(3-State)
1995 Mar 31 5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL PARAMETER TEST CONDITIONS
1
LIMITS
UNIT SYMBOL PARAMETER TEST CONDITIONS
1
MIN TYP
2
MAX
UNIT
V
O
High level output voltage
V
CC
= MIN, V
IL
= MAX,
±
10%V
CC
2.4 V
V
OH
High-level output voltage
CC
,
IL
,
V
IH
= MIN, I
OH
= MAX
±
5%V
CC
2.7 3.3 V
V
O
Low level output voltage
V
CC
= MIN, V
IL
= MAX,
±
10%V
CC
0.35 0.50 V
V
OL
Low-level output voltage
CC
,
IL
,
V
IH
= MIN, I
OL
= MAX
±
5%V
CC
0.35 0.50 V
V
IK
Input clamp voltage V
CC
= MIN, I
I
= I
IK
–0.73 –1.2 V
I
I
Input current at maximum input voltage V
CC
= MAX, V
I
= 7.0V 100
µ
A
I
IH
High-level input current V
CC
= MAX, V
I
= 2.7V 20
µ
A
I
IL
Low-level input current V
CC
= MAX, V
I
= 0.5V –0.6 mA
I
OZH
Off state output current,
High-level voltage applied
V
CC
= MAX, V
O
= 2.7V 50
µ
A
I
OZL
Off state output current,
Low-level voltage applied
V
CC
= MAX, V
O
= 0.5V –50
µ
A
I
OS
Short-circuit output current
3
V
CC
= MAX -60 –150 mA
4
I
CCH
9.0 15.0 mA
I
CC
Supply current
4
(total) I
CCL
V
CC
= MAX 14.5 22.0 mA
I
CCZ
15.0 23.0 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
4. Measure I
CC
with all outputs open and inputs grounded.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL PARAMETER
TEST
CONDITION
T
amb
= +25
°
C
V
CC
= +5.0V
C
L
= 50pF
R
L
= 500
Ω
T
amb
= 0
°
C to +70
°
C
V
CC
= +5.0V
±
10%
C
L
= 50pF
R
L
= 500
Ω
T
amb
= –40
°
C to +85
°
C
V
CC
= +5.0V
±
10%
C
L
= 50pF
R
L
= 500
Ω
UNIT
MIN TYP MAX MIN MAX MIN MAX
t
PLH
t
PHL
Propagation delay
In to Yn
Waveform 1
3.0
2.0 4.5
3.5 6.0
5.0 3.0
2.0 7.0
6.0 3.0
2.0 7.0
7.0
ns
t
PLH
t
PHL
Propagation delay
S to Yn
Waveform 1
5.0
4.0 7.5
5.5 9.5
7.0 5.0
4.0 10.5
8.0
5.0
4.0 10.5
8.5
ns
t
PZH
t
PZL
Output Enable time
to High or Low level Waveform 2
Waveform 3 4.5
4.5 6.5
6.0 7.5
7.5 4.5
4.5 8.5
8.5 4.5
4.5 8.5
8.5
ns
t
PHZ
t
PLZ
Output Disable time
from High or Low level Waveform 2
Waveform 3 2.0
2.0 4.0
3.5 5.5
5.5 2.0
2.0 6.0
6.0 2.0
2.0 6.0
6.0
ns