XE-70 AFM Order of Operations
1)
Turn on system, mount tip if needed
2)
Focus microscope on cantilever
3)
Position laser spot on end of cantilever
4)
Turn on XEP software
5)
Position laser reflection on center of photodetector (A+B ~3V, A-B and C-D ~0.3V)
6)
Select appropriate mode, scanner, and frequency
7)
Approach surface
i.
Get optically close (several mm)
ii.
Focus microscope ~1mm from surface, move Z-stage til cantilever in focus
iii.
Repeat at ~100um from surface
iv.
Click ‘Approach’
8)
Adjust scan parameters (Z servo gain, scan rate, set point, drive)
9)
Collect images
10)
Send to XEI to process/save
11)
Follow shutdown procedure
