3 Prevention of Electro Static Discharge (ESD) to
Electrostatically Sensitive (ES) Devices
Some semiconductor (solid state) devices can be damaged easily by static electricity. Such components commonly are called
Electrostatically Sensitive (ES) Devices. Examples of typical ES devices are integrated circuits and some field-effect transistors and
semiconductor "chip" components. The following techniques should be used to help reduce the incidence of component damage
caused by electro static discharge (ESD).
1. Immediately before handling any semiconductor component or semiconductor-equipped assembly, drain off any ESD on your
body by touching a known earth ground. Alternatively, obtain and wear a commercially available discharging ESD wrist strap,
which should be removed for potential shock reasons prior to applying power to the unit under test.
2. After removing an electrical assembly equipped with ES devices, place the assembly on a conductive surface such as
aluminum foil, to prevent electrostatic charge buildup or exposure of the assembly.
3. Use only a grounded-tip soldering iron to solder or unsolder ES devices.
4. Use only an anti-static solder removal device. Some solder removal devices not classified as "anti-static (ESD protected)" can
generate electrical charge sufficient to damage ES devices.
5. Do not use freon-propelled chemicals. These can generate electrical charges sufficient to damage ES devices.
6. Do not remove a replacement ES device from its protective package until immediately before you are ready to install it. (Most
replacement ES devices are packaged with leads electrically shorted together by conductive foam, aluminum foil or comparable
conductive material).
7. Immediately before removing the protective material from the leads of a replacement ES device, touch the protective material
to the chassis or circuit assembly into which the device will be installed.
Caution
Be sure no power is applied to the chassis or circuit, and observe all other safety precautions.
8. Minimize bodily motions when handling unpackaged replacement ES devices. (Otherwise hamless motion such as the brushing
together of your clothes fabric or the lifting of your foot from a carpeted floor can generate static electricity (ESD) sufficient to
damage an ES device).
6
TH-42PH9WK / TH-42PH9WS
Summary of Contents for TH-42PH9WK
Page 4: ...1 Applicable signals 4 TH 42PH9WK TH 42PH9WS ...
Page 23: ...8 4 Adjustment Volume Location 8 5 Test Point Location 23 TH 42PH9WK TH 42PH9WS ...
Page 27: ...9 2 IIC mode structure following items value is sample data 27 TH 42PH9WK TH 42PH9WS ...
Page 29: ...29 TH 42PH9WK TH 42PH9WS ...
Page 31: ...31 TH 42PH9WK TH 42PH9WS ...
Page 37: ...12 Option Setting 37 TH 42PH9WK TH 42PH9WS ...
Page 61: ...14 Block and Schematic Diagram 14 1 Schematic Diagram Notes TH 42PH9WK TH 42PH9WS 61 ...
Page 112: ...NOTE TH 42PH9WK TH 42PH9WS 112 ...
Page 113: ...15 Parts Location 15 1 Exploded View 113 TH 42PH9WK TH 42PH9WS ...
Page 114: ...15 1 1 Escutcheon part location enlarged view 114 TH 42PH9WK TH 42PH9WS ...
Page 115: ...15 1 2 Fan relation 15 2 Cable relation 115 TH 42PH9WK TH 42PH9WS ...
Page 116: ...15 3 Packing summary 116 TH 42PH9WK TH 42PH9WS ...
Page 117: ...117 TH 42PH9WK TH 42PH9WS ...
Page 119: ...17 Replacement Parts List 17 1 Replacement Parts List Notes 119 TH 42PH9WK TH 42PH9WS ...
