3 Prevention of Electro Static Discharge (ESD) to
Electrostatically Sensitive (ES) Devices
Some semiconductor (solid state) devices can be damaged easily by static electricity. Such components commonly are called
Electrostatically Sensitive (ES) Devices. Examples of typical ES devices are integrated circuits and some field-effect transistors and
semiconductor "chip" components. The following techniques should be used to help reduce the incidence of component damage
caused by electro static discharge (ESD).
1. Immediately before handling any semiconductor component or semiconductor-equipped assembly, drain off any ESD on your
body by touching a known earth ground. Alternatively, obtain and wear a commercially available discharging ESD wrist strap,
which should be removed for potential shock reasons prior to applying power to the unit under test.
2. After removing an electrical assembly equipped with ES devices, place the assembly on a conductive surface such as
aluminum foil, to prevent electrostatic charge buildup or exposure of the assembly.
3. Use only a grounded-tip soldering iron to solder or unsolder ES devices.
4. Use only an anti-static solder removal device. Some solder removal devices not classified as "anti-static (ESD protected)" can
generate electrical charge sufficient to damage ES devices.
5. Do not use freon-propelled chemicals. These can generate electrical charges sufficient to damage ES devices.
6. Do not remove a replacement ES device from its protective package until immediately before you are ready to install it. (Most
replacement ES devices are packaged with leads electrically shorted together by conductive foam, aluminum foil or comparable
conductive material).
7. Immediately before removing the protective material from the leads of a replacement ES device, touch the protective material
to the chassis or circuit assembly into which the device will be installed.
Caution
Be sure no power is applied to the chassis or circuit, and observe all other safety precautions.
8. Minimize bodily motions when handling unpackaged replacement ES devices. (Otherwise hamless motion such as the brushing
together of your clothes fabric or the lifting of your foot from a carpeted floor can generate static electricity (ESD) sufficient to
damage an ES device).
7
TH-37PH9UK / TH-42PH9UK
Summary of Contents for TH-37PH9UK
Page 5: ...1 Applicable signals 5 TH 37PH9UK TH 42PH9UK ...
Page 37: ...9 4 Adjustment Volume Location 9 4 1 TH 37PH9UK 9 4 2 TH 42PH9UK 37 TH 37PH9UK TH 42PH9UK ...
Page 38: ...9 5 Test Point Location 9 5 1 TH 37PH9UK 9 5 2 TH 42PH9UK 38 TH 37PH9UK TH 42PH9UK ...
Page 42: ...10 2 IIC mode structure following items value is sample data 42 TH 37PH9UK TH 42PH9UK ...
Page 44: ...44 TH 37PH9UK TH 42PH9UK ...
Page 46: ...46 TH 37PH9UK TH 42PH9UK ...
Page 52: ...13 Option Setting 52 TH 37PH9UK TH 42PH9UK ...
Page 54: ...54 TH 37PH9UK TH 42PH9UK ...
Page 87: ...15 Block and Schematic Diagram 15 1 Schematic Diagram Notes TH 37PH9UK TH 42PH9UK 87 ...
Page 161: ...16 Parts Location 16 1 Exploded View 16 1 1 TH 37PH9UK 161 TH 37PH9UK TH 42PH9UK ...
Page 162: ...16 1 2 TH 42PH9UK 162 TH 37PH9UK TH 42PH9UK ...
Page 163: ...16 1 3 Escutcheon part location enlarged view for 37 42 inch 163 TH 37PH9UK TH 42PH9UK ...
Page 164: ...16 2 Cable relation 16 2 1 TH 37PH9UK 16 2 2 TH 42PH9UK 164 TH 37PH9UK TH 42PH9UK ...
Page 165: ...16 3 Packing summary 165 TH 37PH9UK TH 42PH9UK ...
Page 167: ...18 Replacement Parts List 18 1 Replacement Parts List Notes 167 TH 37PH9UK TH 42PH9UK ...