4
2 Warning
2.1.
Prevention of Electrostatic Discharge (ESD) to Electrostatically
Sensitive (ES) Devices
Some semiconductor (solid state) devices can be damaged easily by static electricity. Such components commonly are called Elec-
trostatically Sensitive (ES) Devices. Examples of typical ES devices are integrated circuits and some field-effect transistors and
semiconductor “chip” components. The following techniques should be used to help reduce the incidence of component damage
caused by electrostatic discharge (ESD).
1. Immediately before handling any semiconductor component or semiconductor-equipped assembly, drain off any ESD on your
body by touching a known earth ground. Alternatively, obtain and wear a commercially available discharging ESD wrist strap,
which should be removed for potential shock reasons prior to applying power to the unit under test.
2. After removing an electrical assembly equipped with ES devices, place the assembly on a conductive surface such as alumi-
num foil, to prevent electrostatic charge buildup or exposure of the assembly.
3. Use only a grounded-tip soldering iron to solder or unsolder ES devices.
4. Use only an antistatic solder removal device. Some solder removal devices not classified as “antistatic (ESD protected)” can
generate electrical charge sufficient to damage ES devices.
5. Do not use freon-propelled chemicals. These can generate electrical charges sufficient to damage ES devices.
6. Do not remove a replacement ES device from its protective package until immediately before you are ready to install it. (Most
replacement ES devices are packaged with leads electrically shorted together by conductive foam, aluminum foil or compara-
ble conductive material).
7. Immediately before removing the protective material from the leads of a replacement ES device, touch the protective material
to the chassis or circuit assembly into which the device will be installed.
CAUTION :
Be sure no power is applied to the chassis or circuit, and observe all other safety precautions.
8. Minimize bodily motions when handling unpackaged replacement ES devices. (Otherwise harmless motion such as the
brushing together of your clothes fabric or the lifting of your foot from a carpeted floor can generate static electricity (ESD) suf-
ficient to damage an ES device).
2.2.
How to Recycle the Lithium Ion Battery (U.S. Only)
Summary of Contents for HC-V201P
Page 9: ...9 3 5 Formatting ...
Page 11: ...11 4 Specifications 4 1 For NTSC Areas ...
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Page 17: ...17 4 2 For PAL Areas ...
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Page 36: ...36 8 3 1 Removal of the Side Case L Unit Fig D1 Fig D2 ...
Page 37: ...37 8 3 2 Removal of the Top Case Fig D3 8 3 3 Removal of the Barrier Front Unit Fig D4 ...
Page 39: ...39 Fig D9 Fig D10 ...
Page 41: ...41 Fig D14 Fig D15 ...
Page 42: ...42 8 3 8 Removal of the MOS Unit IR Cut Glass Fig D16 Fig D17 ...
Page 43: ...43 Fig D18 8 3 9 Removal of the 2nd Stepping Motor Focus Stepping Motor Fig D19 ...
Page 44: ...44 Fig D20 8 3 10 Removal of the Barrier Unit Fig D21 ...
Page 46: ...46 8 3 12 Removal of the Rear Cover Unit Top Operation BATT Catcher P C B Fig D24 Fig D25 ...
Page 49: ...49 9 1 2 Adjustment Items Adjustment item as follows ...
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