
Overview
150-101-100-02, Revision 02
2
June 8, 1999
HTC-439 List 1
T
EST
C
ARD
Test points on the HTC-439 (
) provide access to each circuit under
test as well as to frame ground. The four-position test slider switch (S1)
selects which test (Open, Short, Loop Thru, or Loop Back) is to be performed
on CO and field circuits. The Open switch position effectively provides a
splitting-type access to one pair of the CO and field sides and the 210 jacks.
The Loop Back or Loop Thru switch positions allow you to use the two
miniature 210 jacks located within the J1 block. All tests are run on both side
1 and side 2. Refer to
for further information.
Figure 1.
HTC-439 List 1 Test Card
CO
SIDE 1
SIDE 1
T
T
R
R
TP5
TP6
TP9
TP8
CO
CO
TP3
TP4
TP12
TP11
TP1
FIELD
FIELD
OPEN
SHORT
LOOP THRU
LOOP BACK
FIELD
SIDE 2
SIDE 2
PairGain
S1 switch
S1 switch
positions
Circuit schematic
Conector pins
1
12
Miniature
210 jacks
Test points