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Chapter 35 IEEE 1149.1 Test Access Port Controller (JTAGC)
MPC5602P Microcontroller Reference Manual, Rev. 4
Freescale Semiconductor
855
Chapter 35
IEEE 1149.1 Test Access Port Controller (JTAGC)
35.1
Introduction
The JTAG port of the device consists of three inputs and one output. These pins include test data input
(TDI), test mode select (TMS), test clock input (TCK) and test data output (TDO). TDI, TMS, TCK and
TDO are compliant with the IEEE 1149.1-2001 standard and are shared with the NDI through the test
access port (TAP) interface.
35.2
Block diagram
is a block diagram of the JTAG Controller (JTAGC).
Figure 35-1. JTAG controller block diagram
35.3
Overview
The JTAGC provides the means to test device functionality and connectivity while remaining transparent
to system logic when not in test mode. Testing is performed via a boundary scan technique, as defined in
the IEEE 1149.1-2001 standard. In addition, instructions can be executed that allow the Test Access Port
(TAP) to be shared with other modules on the MCU. All data input to and output from the JTAGC is
communicated in serial format.
TCK
TMS
TDI
Test access port (TAP)
TDO
32-bit device identification register
Boundary scan register
controller
1-bit bypass register
5-bit TAP instruction decoder
5-bit TAP instruction register
Power-on
reset