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4/2022
NXP Semiconductors
UM11401
FRDMGD31RPEVM half-bridge evaluation board
Test point Definition
Low-voltage domain
VSUP
DC voltage source connection point for VSUP power input of GD3100 devices.
Typically supplied by vehicle b12 V DC.
GND1
grounding points for low-voltage domain
INTBL
interrupt bar low-side test point
INTBH
interrupt bar high-side test point
Low-side driver domain
VCCL
positive voltage supply test point for isolated circuitry and low-side driver domain
DSTL
V
CE
desaturation test point connected to low-side driver DESAT pin and circuitry
VEEL
negative voltage supply test point for low-side driver gate of IGBT or SiC module
VDC
DC link voltage test point at voltage divider
VRFL
5.0 V reference test point for isolated analog circuitry on low-side driver
GNDISOL
low-side driver grounding points
GL
module gate test point on low-side driver domain which is the charging pin of gate;
including MMCX probe connection
COLL
collector test point/connection terminal on low side
High-side driver domain
VCCH
positive voltage supply test point for isolated circuitry and high-side driver domain
DSTH
V
CE
desaturation test point connected to high-side driver DESAT pin and circuitry
VEEH
negative voltage supply test point for high-side driver gate of IGBT or SiC module
AMXH
analog MUX input test point for high-side driver
VRFH
5.0 V reference test point for isolated analog circuitry on high-side driver
TSNS1
NTC1 test point at module and TSENSEH high-side
TSNS2
NTC2 test point at module and GNDISOH
GNDISOH
high-side driver grounding points
GH
module gate test point on high-side driver domain which is the charging pin of gate;
including MMCX probe connection
COLH
collector test point/connection high side
Table 3. Test point definitions
UM11401
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User guide
Rev. 2 — 22 January 2021
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