NXP Semiconductors K32 L2A Series, Reference Manual, Page: 1226 / 1379

48.1.3.3.9 TRNG0 Total Samples (TRNG0_TOTSAM)
48.1.3.3.9.1 Address
Register Offset Description
TRNG0_TOTSAM 400A5014h Accessible at this address when
TRNG0_MCTL[PRGM] = 0]
48.1.3.3.9.2 Function
The TRNG0 Total Samples Register is a read-only register used to read the total number
of samples taken during Entropy generation. It is used to give an indication of how often
a sample is actually used during Von Neumann sampling. Note that this offset (0x14) is
used as TRNG0_SBLIM if TRNG0_MCTL[PRGM] is 1. If TRNG0_MCTL[PRGM] is
0, this offset is used as TRNG0_TOTSAM readback register, as described here.
48.1.3.3.9.3 Diagram
Bits 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16
R
Reserved
TOT_SAM
W
Reset
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
Bits 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
R TOT_SAM
W
Reset
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
48.1.3.3.9.4 Fields
Field Function
31-20
—
Reserved. Always 0.
19-0
TOT_SAM
Total Samples. During Entropy generation, the total number of raw samples is counted. This count is
useful in determining how often a sample is used during Von Neumann sampling. The count may be read
through this register, if TRNG0_MCTL[PRGM] bit is 0. Note that if TRNG0_MCTL[PRGM] bit is 1, this
register address is used to access the Sparse Bit Limit in register TRNG0_SBLIM, as defined in the
previous section.
Standalone True Random Number Generator (SA-TRNG).
K32 L2A Reference Manual, Rev. 2, 01/2020
1226 NXP Semiconductors