NXP Semiconductors freescale MC92604, User Manual, Page: 34 / 56

Test Setups
MC92604 Dual GEt Design Verification Board User’s Guide, Rev. 1
4-4 Freescale Semiconductor
4.2 Jitter Testing
The following tests are guidelines for verifying the performance of MC92604 in ‘noisy’ conditions.
Results will vary depending on input reference frequencies, MC92604 mode of operation, test setup and
equipment, and test environment.
4.2.1 Jitter Test System Calibration
Before beginning any type of jitter measurements, the system must first be calibrated, as shown in the
configuration in
Figure 4-3 , to produce the desired frequency and amplitude modulation of the jittered
source. The amplitude of modulation is then translated into jitter in units of peak-to-peak unit intervals
(UIp-p). Different synthesized sweepers have different characteristics at different frequencies. It is
possible that certain frequencies will produce spurious side lobes which will affect jitter characterization.
It is strongly advised that a bandpass filter centered on the carrier frequency be used at the input to the
microwave transition analyzer. Refer to the synthesized sweeper reference Guide for more details.
Figure 4-3. Jitter Measurement System Calibration
Function
Generator
Modu
lation
Sig
nal
10-MHz Ref
e
re
nce Cloc
k
HPIB
Power
Splitter
Jittered
Clock
Filter
Synthesized
Sweeper
(Carrier Frequency)
70000 Mainframe
with Microwave
Transition Analyzer
Ch1
Ch2
50
Ω