54
NED
RMSL4K100CP
UME-0114-01
4.10.4 Test Pattern
This camera can generate two types of patterns as follows.
Use these test patterns to verify the proper timing and connections between the
camera and the frame grabber board.
Figure 4-10-4-1 Waveforms of the horizontal ramp pattern on Mono8
Figure 4-10-4-2 Image of the horizontal ramp pattern on Mono8
Where pixel 0 has the value 0DN, the value increases by 1DN each pixel, up to
255DN, then the pattern repeats.
Figure 4-10-4-3 Waveforms of the horizontal ramp pattern on Mono10
Figure 4-10-4-4 Image of the horizontal ramp pattern on Mono1
Where pixel 0 has the value 0DN, the value increases by 1DN each pixel, up to
1023DN, then the pattern repeats.
