Index
©
National Instruments Corporation
I-3
SCXI-1581 User Manual
relationship between resistance and
temperature, B-2
resistance-temperature curve (figure), B-3
S
safety specifications, A-2
SCXI chassis
connecting SCXI-1520 to DAQ
device, 1-4
removing SCXI-1126, 1-13
SCXI-1200 module, controlling SCXI-1581
with, C-5
SCXI-1303 terminal block, C-5
SCXI-1581
common questions, C-1
digital signals unavailable signals with
DAQ device connected (table), C-3
installation, 1-2
overview, 1-1
self-test verification
steps for, 1-9, 1-11
troubleshooting, 1-12
signal connections
front connector
pin assignments (table), 2-2
rear signal connector
pin assignments (figure), 2-4
software
installation, 1-2
NI-DAQ version required, C-1
specifications
CE compliance, A-3
electromagnetic compatibility, A-2
environment, A-2
excitation, A-1
physical, A-2
power requirements from SCXI
backplane, A-1
safety, A-2
stability, A-1
stability specifications, A-1
T
temperature measurement with resistive
transducers, B-1
connecting resistive devices to
SCXI-1581, B-11
2-wire configuration, B-13
3-wire resistive sensor connected in
2-wire configuration, B-14
4-wire configuration, B-12
lead resistance compensation
using 3-wire resistive sensor and two
differential amplifiers, B-16
using 3-wire resistive sensor and two
matched current sources, B-15
RTDs
Callendar-Van Dusen coefficients
(table), B-4
measurement errors, B-6
overview, B-1
relationship between resistance and
temperature, B-2
resistance temperature curve
(figure), B-3
thermistors
measurement circuits, B-10
overview, B-7
resistance/temperature
characteristics, B-9
resistance-temperature curve
(figure), B-8
theory of multiplexed hardware operation, 2-5