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A F
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EASUREMENT
52
grated optics. The tip should not come closer to the sample than a few
times the cantilever width. (figure
View of the cantilever after manual
, left
).
- Whilst observing the tip sample distance, click and hold
until
the tip is close enough to the sample.
The sample should now be in focus. Now use the top view image to find a
suitable location to measure on. In the top view, the sample is seen from a
direction perpendicular to its surface (figure
View of the cantilever after man-
, right
). To use the top view:
- If the Video Module is installed, click
in the Video
panel.
- If you do not have the Video Module, use the top view lens to observe the
sample instead.
If necessary, move the sample holder to find a suitable location that is free
of dust particles.
Automatic final approach
In the last step, the tip approaches the sample until the set point is reached.
First check that you are using the right operating mode and cantilever:
- Click
in the navigator to open the Operating Mode panel.
View of the cantilever after manual approach: left: side view, right: top view
Summary of Contents for easyScan 2 AFM
Page 1: ...Operating Instructions easyScan 2 AFM Version 1 6...
Page 7: ...7...
Page 86: ...AFM THEORY 86 Scanner coordinate system x y...
Page 159: ...THE SCRIPT CONFIGURATION DIALOG 159 This page was intentionally left blank...
Page 160: ...AUTOMATING MEASUREMENT TASKS 160 This page was intentionally left blank...
Page 161: ...THE SCRIPT CONFIGURATION DIALOG 161 This page was intentionally left blank...
Page 163: ...163 Window Operating windows Imaging 120 Positioning 115 Report 153 Spectroscopy 128...
Page 164: ......