Temperature
Compensating Type
High Dielectric Type
Pre-and Post-Stress
Electrical Test
2 High Temperature
The measured and observed characteristics should satisfy the
Set the capacitor for 1000±12 hours at 150±3
℃
. Set for
Exposure (Storage)
specifications in the following table.
24±2 hours at room temperature, then measure.
Appearance
No marking defects
Capacitance
Within ±2.5% or ±0.25pF
R7/L8/R9: Within ±10.0%
Change
(Whichever is larger)
Q/D.F.
30pFmin. : Q
≧
1000
R7/L8 W.V.: 25Vmin.: 0.03 max.
30pFmax.: Q
≧
400+20C
W.V.: 16V/10V : 0.05 max.
C: Nominal Capacitance(pF)
R9 : 0.075max.
I.R.
More than 10,000M
Ω or 500Ω
・
F
(Whichever is smaller)
R9 : More than 150Ω
・
F
3 Temperature Cycling
The measured and observed characteristics should satisfy the
Fix the capacitor to the supporting jig in the same manner and under
specifications in the following table.
the same conditions as (19). Perform cycle test according to the four
Appearance
No marking defects
heat treatments listed in the following table. Set for 24±2 hours at
Capacitance
Within ±2.5% or ±0.25pF
R7/L8/R9: Within ±10.0%
room temperature, then measure
Change
(Whichever is larger)
Q/D.F.
30pFmin. : Q
≧
1000
R7/L8 W.V.: 25Vmin.: 0.03 max.
30pFmax.: Q
≧
400+20C
W.V.: 16V/10V : 0.05 max.
C: Nominal Capacitance(pF)
R9 : 0.05max.
I.R.
More than 10,000M
Ω or 500Ω
・
F
(Whichever is smaller)
・
Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10
℃
for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
4 Destructive
No defects or abnormalities
Per EIA-469.
Phisical Analysis
5 Moisture Resistance
The measured and observed characteristics should satisfy the
Apply the 24-hour heat (25 to 65
℃
) and humidity (80 to 98%)
specifications in the following table.
treatment shown below, 10 consecutive times.
Appearance
No marking defects
Set for 24
±
2 hours at room temperature, then measure.
Capacitance
Within ±3.0% or ±0.30pF
R7/L8/R9: Within ±12.5%
Change
(Whichever is larger)
Q/D.F.
30pFmin. : Q
≧
350
R7/L8 : W.V.: 25Vmin.: 0.03 max.
10pF and over, 30pF and below:
W.V.: 16V/10V : 0.05 max.
Q
≧
275+5C/2
R9 : 0.075max.
10pFmax.: Q
≧
200+10C
C: Nominal Capacitance(pF)
I.R.
More than 10,000M
Ω or 500Ω
・
F
(Whichever is smaller)
R9 : More than 150
Ω
・
F
6 Biased Humidity
The measured and observed characteristics should satisfy the
Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8kΩ resister)
specifications in the following table.
at 85±3
℃
and 80 to 85% humidity for 1000±12 hours.
Appearance
No marking defects
Remove and set for 24±2 hours at room temprature, then measure.
Capacitance
Within ±3.0% or ±0.30pF
R7/L8/R9: Within ±12.5%
The charge/discharge current is less than 50mA.
Change
(Whichever is larger)
Q/D.F.
30pF and over: Q
≧
200
R7/L8 W.V.: 25Vmin.: 0.035 max.
30pF and below: Q
≧
100+10C/3
W.V.: 16V/10V : 0.05 max.
C: Nominal Capacitance(pF)
R9 : 0.075max.
I.R.
More than 1,000M
Ω or 50Ω
・
F
(Whichever is smaller)
■
AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
AEC-Q200 Test Method
Specification.
1
-
Step
Time(min)
Cycles
1000(for ΔC/R7)
300(for 5G/L8/R9)
1
15±3
-55℃+0/-3
-55℃+0/-3
2
1
Room
Room
3
15±3
125℃+3/-0
150℃+3/-0
4
1
Room
Room
One cycle 24hours
Hours
Initial measuremt
+10
- 2 ℃
Humidity
90～98%
Humidity
80～98%
Humidity
80～98%
Humidity
90～98%
Humidity
90～98%
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
Temperature
70
65
60
55
50
45
40
35
30
25
20
15
10
5
0
-5
-10
(℃)
JEMCGS-0363S
2
