MOTOROLA
Chapter 6. Test Features
6-1
Chapter 6
Test Features
This chapter consists of the following sections:
•
Section 6.1, “IEEE Std. 1149.1 Implementation”
•
Section 6.2, “System Accessible Test Modes”
•
Section 6.3, “BIST Sequence Test with Internal Digital Loopback Mode”
The MC92603 supports several test modes for built-in system test, BIST, and production
testing. The MC92603 also has an IEEE Std. 1149.1 [3] compliant test access port and
boundary scan architecture implementations. This chapter covers the JTAG
implementation and the system accessible test modes.
6.1
IEEE Std. 1149.1 Implementation
This section describes the IEEE Std. 1149.1 compliant test access port and boundary scan
architecture implementation in the MC92603.
6.1.1
Test Access Port (TAP) Interface Signals
Table 6-1 lists the interface signals for the TAP.
Table 6-1. TAP Interface Signals
Signal
Name
Description
Function
Direction
Active
State
TCK
Test clock
Test logic clock
Input
—
TMS
Test mode select
TAP mode control input
Input
—
TDI
Test data in
Serial test instruction/data input
Input
—
TRST
Test reset bar
Asynchronous test controller reset
Input
Low
TDO
Test data out
Serial test instruction/data output
Output
—
Summary of Contents for MC92603
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