Instruction Manual MIT-SCAN-T3
Version 02/2021
Page 47
5.4
Set up of measuring sites at the PC
Measuring sites can conveniently be prepared at the PC. The interface
is in the second tab “Prepare measurements” (s. Fig. 41).
If measurements for several layer thickness measuring devices are
processed, the relevant device has to selected (s. highlighted area in
Fig. 40). The list of target devices contains all by license key registered
devices.
Fig. 40 Device specific
measuring site set up
Fig. 41 Measurements set up with the MIT project software
Summary of Contents for MIT-SCAN-T3
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