LANGER EMV-Technik P1401, User Manual

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LANGER
EMV-Technik
DE-01728 Bannewitz
mail@langer-emv.de
www.langer-emv.com
P1401/P1501 and P1402/P1502 set
2 Description of the system
Use 2.1
The P1401/P1501 set or P1402/P1502 set can be used to measure the immunity of integrated
circuits (ICs) to magnetic and electric fields in the frequency range of up to 1 GHz and 3 GHz,
respectively.
The P1401 or P1402 field source is used to generate a magnetic test field and the P1501 or P1502
field source to generate an electric test field. The respective field source is positioned above the
test IC by using a spacer ring and its test field is then applied to the IC to measure its immunity to
disturbances.
Figure 1
shows the basic set-up for immunity measurements with the P1501 field source as an
example. The P1401/P1501 or P1402/P1502 IC test system, the ICE1
1
IC test environment as well
as different measuring and test devices
2
are required for the measurement set-up:
Note: The P1401 or P1402 field source is operated under short-circuit conditions and the P1501
or P1502 field source is operated under open-circuit conditions. Any power amplifier that is used
to supply the field sources must be designed for this purpose, i.e. it must be stable under open-
circuit conditions and short-circuit proof.
Figure 1 Basic set-up for immunity measurements using the ICE1 IC test environment and P1401/P1501
IC test system (here: P1501 field source)
1
not included in the scope of delivery
2
not included in the scope of delivery