Kikusui TOS9200, Operation Manual

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4-4 Using Terminals and Connectors TOS9200/9201
4.2 SIGNAL I/O Connector
• To prevent electric shock, turn off the device before connecting/discon-
necting a cable.
• Keep the signal line at least 500 mm from the high-voltage test leadwire
and the DUT. Do not short-circuit the test voltage to the signal line. Other-
wise, all internal circuits may be destroyed.
The SIGNAL I/O connector is the 25-pin D-SUB connector on the rear panel.
By inputting a signal to the SIGNAL I/O connector, a test can be started/stopped
and the panel memory and program memory can be recalled. In addition, the status
of the tester can be checked using the output signal from the SIGNAL I/O connec-
tor.
Connector on the rear panel
XM3B-2522 D-sub 25-pin female connector
(socket); manufactured by OMRON Corporation,
Screw M2.6 x 0.45
Complies connector (plug)
D-sub 25-pin male (with fi x screw M2.6)
• For 25-pin D-SUB connectors and cables, use a shielded type with a length of 3 m
or less to prevent malfunction due to noise.
• The internal control circuit of the tester is designed to prevent malfunction caused
by noise generated by the tester or peripheral devices. However, connected
devices may malfunction if unshielded cables are connected to SIGNAL I/O ter-
minals, because such cables would virtually make a sort of “antenna” to pick up
external noise. To avoid this problem, use metal connectors, shielded cables, and
external circuits housed in a shielded case. Connect them to the tester’s housing
(do not connect the COM line to a shield or an earth ground). These measures
insulate SIGNAL I/O-related circuits from the external environment, thus reduc-
ing malfunction due to noise.
WARNING
CAUTION
SIGNAL I/O connector
Fig.4-2 SIGNAL I/O
NOTE