Keysight InfiniiMax III+ Series, User Manual

Page: 33 / 162

Using InfiniiMax III+ Series Probes
1
InfiniiMax III+ Series Probes User’s Guide 33
N5449A high impedance adapter
The N5449A high impedance adapter includes one N2873A 10:1 passive probe.
The adapter is specifically tuned for the N2873A probe. Similar probes (1
Μ W
input) can be used. Other probes may not meet the bandwidth specification.
86100D sampling scope adapters
Two adapters are available for connecting probes to the Infiniium 86100D DCA-X
sampling oscilloscope or other RF instruments. The N1022B sampling scope
adapter allows you to connect N2830/1/2A probes. The N5477A sampling scope
adapter allows you to connect N7000/1/2A probes.
CAUTION
Avoid rapid changes in temperature that can lead to moisture accumulating in the
form of condensation on the probe components, as well as the DUT. If this occurs, wait
until the moisture has evaporated before making any measurements.
CAUTION
Additional care must be taken when handling probe heads used during extreme
temperature cycling because this process makes the probe heads less robust.
CAUTION
Secure the ends of the extension cable near the probe head in the temperature
chamber such that the probe head legs are not tugged or moved around significantly.
CAUTION
Prevent abrasion and tears in the cable’s jacket, do not rest the extension cables on
any metal objects or objects with sharp edges.
CAUTION
Do not kink the cables. The cables are designed to be flexible, but are not designed to
be bent sharply.
NOTE
Keep your extreme temperature testing probes separate from the probes that you use under
milder conditions. This is because cycling probe heads through extreme temperature ranges
has a marked affect on their lifetimes. Only the lifetime of the probe head is affected by
temperature cycling. The extension cables and probe amplifier should not need to be replaced
with extended temperature cycling.
NOTE
Discoloration or texture changes are possible with the extension cables. These changes do
not, however, affect the performance or the quality of a measurement.